Numerically focused optical coherence microscopy with structured illumination aperture
نویسندگان
چکیده
منابع مشابه
Full-color structured illumination optical sectioning microscopy
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Structured illumination microscopy (SIM) is a wide-field technique that rivals confocal microscopy in optical sectioning ability at a small fraction of the acquisition time. For standard detectors such as a CCD camera, SIM requires a minimum of three sequential frame captures, limiting its usefulness to static objects. By using a color grid and camera, we surpass this limit and achieve optical ...
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ژورنال
عنوان ژورنال: Computer Optics
سال: 2018
ISSN: 2412-6179,0134-2452
DOI: 10.18287/2412-6179-2018-42-2-248-253